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(parent: 9ffd7ff) | patch
media: imx258: remove test pattern map from driver
authorChen, JasonX Z <jasonx.z.chen@intel.com>
Thu, 8 Nov 2018 02:47:34 +0000 (21:47 -0500)
committerMauro Carvalho Chehab <mchehab+samsung@kernel.org>
Fri, 23 Nov 2018 09:43:59 +0000 (04:43 -0500)
commit53f6f81da7db96557fe2bff9b15bd6b83d301f9f
tree5b9cdaae4b6e050a371008b224452161aa977485tree | snapshot
parent9ffd7ffe6504379d40b07b03510f3ef080f85af9commit | diff
media: imx258: remove test pattern map from driver

change bayer order when using test pattern mode.
remove test pattern mapping method

[Sakari Ailus: Drop extra added newline]

Signed-off-by: Chen, JasonX Z <jasonx.z.chen@intel.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
drivers/media/i2c/imx258.c diff | blob | history
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